Sciweavers

Share
ATS
2003
IEEE

STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data

10 years 7 months ago
STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is achieved by compressing the don’t-care bit information, while maintaining the care bit data. The original care bit density, hence, dominates the theoretical compression limits. This paper discusses potential on-chip hardware decoder architectures that allow for combining care bit oriented methods with test cube clustering to achieve multilevel test stimulus compression that reduces the data for both care bits and don’t-care bits.
Bernd Koenemann
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ATS
Authors Bernd Koenemann
Comments (0)
books