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11

ITC
1999
IEEE

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Static component interconnection test technology in practice

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Static component interconnection test technology in practice

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Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test method using simple patterns and results in a high diagnostic resolution. The method is especially suited for SDRAM and other `complex memories' but can be used for other devices as well. Very little overhead is required. A real silicon implementation is presented and evaluated.

Frans De Jong, Rob Raaijmakers

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Board-level Interconnection Test | Hardware | Interconnection Test | Interconnection Test Technology | ITC 1999 |

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Added	04 Aug 2010
Updated	04 Aug 2010
Type	Conference
Year	1999
Where	ITC
Authors	Frans De Jong, Rob Raaijmakers

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