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2011
IEEE

Structural Test for Graceful Degradation of NoC Switches

9 years 4 months ago
Structural Test for Graceful Degradation of NoC Switches
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is increased at the cost of reduced performability. In this paper, a new diagnosis method based on the standard flow of industrial volume testing is presented, which is able to identify the intact functions rather than providing only a pass/fail result for the complete switch. The new method combines for the first time the precision of structural testing with information on the functional behavior in the presence of defects to determine the unaffected switch functions and use partially defective NoC switches. According to the experimental results, this improves the performability of NoCs as more than 61% of defects only impair one switch port. Unlike previous methods for implementing fault tolerant switches, the developed technique does not impose any additional area overhead and is compatible with any switch...
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-J
Added 20 Dec 2011
Updated 20 Dec 2011
Type Journal
Year 2011
Where ETS
Authors Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich
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