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8

ITC
1993
IEEE

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Structure and Metrology for an Analog Testability Bus

13 years 9 months ago

Structure and Metrology for an Analog Testability Bus

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Kenneth P. Parker, John E. McDermid, Stig Oresjo

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» Metrology for analog module testing using analog testability bus

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Added	08 Aug 2010
Updated	08 Aug 2010
Type	Conference
Year	1993
Where	ITC
Authors	Kenneth P. Parker, John E. McDermid, Stig Oresjo

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