ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...