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DATE
2010
IEEE

A systematic approach to the test of combined HW/SW systems

9 years 5 months ago
A systematic approach to the test of combined HW/SW systems
Abstract—Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition.
Alexander Krupp, Wolfgang Müller 0003
Added 10 Jul 2010
Updated 10 Jul 2010
Type Conference
Year 2010
Where DATE
Authors Alexander Krupp, Wolfgang Müller 0003
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