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11

DATE
2010
IEEE

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A systematic approach to the test of combined HW/SW systems

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A systematic approach to the test of combined HW/SW systems

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Abstract—Today we can identify a big gap between requirement speciﬁcation and the generation of test environments. This article extends the Classiﬁcation Tree Method for Embedded Systems (CTM/ES) to ﬁll this gap by new concepts for the precise speciﬁcation of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria deﬁnition and for functional coverage deﬁnition.

Alexander Krupp, Wolfgang Müller 0003

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Big Gap | Continuous Acceptance Criteria | Continuous Control Systems | DATE 2010 | Hardware |

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Added	10 Jul 2010
Updated	10 Jul 2010
Type	Conference
Year	2010
Where	DATE
Authors	Alexander Krupp, Wolfgang Müller 0003

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