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APSEC
2009
IEEE

Test Coverage Metric for Two-Staged Language with Abstract Interpretation

13 years 11 months ago
Test Coverage Metric for Two-Staged Language with Abstract Interpretation
Taeksu Kim, Chunwoo Lee, Kiljoo Lee, Soohyun Baik,
Added 18 May 2010
Updated 18 May 2010
Type Conference
Year 2009
Where APSEC
Authors Taeksu Kim, Chunwoo Lee, Kiljoo Lee, Soohyun Baik, Chisu Wu, Kwangkeun Yi
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