2 search results - page 1 / 1 » Test Coverage Metric for Two-Staged Language with Abstract I... |
APSEC
2009
IEEE
14 years 3 days ago
2009
IEEE
UML
2004
Springer
13 years 10 months ago
2004
Springer
Abstract. In this paper, we propose a verification methodology for System-OnChip (SoC) design using Unified Modeling Language (UML). We introduce UML as a formal model to analyze a...