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ASPDAC
1995
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ASPDAC 1995
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A tool for measuring quality of test pattern for LSIs' functional design
14 years 29 days ago
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www.cs.york.ac.uk
Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Ken
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Added
25 Aug 2010
Updated
25 Aug 2010
Type
Conference
Year
1995
Where
ASPDAC
Authors
Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Kennosuke Fukami
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Researcher Info
Hardware Study Group
Computer Vision