86 search results - page 1 / 18 » WISE: Automated test generation for worst-case complexity |
ICSE
2009
IEEE-ACM
13 years 11 months ago
2009
IEEE-ACM
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
ANTS
2010
Springer
13 years 8 months ago
2010
Springer
Let p be a rational prime and let Φ(X) be a monic irreducible polynomial in Z[X], with nΦ = deg Φ and δΦ = vp(disc Φ). In [13] Montes describes an algorithm for the decomposi...
ICRA
2007
IEEE
13 years 11 months ago
2007
IEEE
— We describe the design, fabrication, and testing of an ultra-low cost Orthotweezers system for microassembly. By utilizing rapid prototyping technology, compliant mechanisms, a...
SEKE
2010
Springer
13 years 3 months ago
2010
Springer
—The behavior of complex production automation systems is hard to predict, therefore simulation is used to study the likely system behavior. However, in a real-world system many ...
KBSE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract—Test coverage such as branch coverage is commonly measured to assess the sufficiency of test inputs. To reduce tedious manual efforts in generating high-covering test i...