As device sizes continue shrinking, lower charges are needed to activate gates, and consequently ever smaller external events (such as single ionizing particles of naturally occurr...
In radiation environments, alpha particles, cosmic rays and solar wind flux can cause a single event upset (SEU), which is one of the major sources of bit-flips in digital electro...
Control flow checking (CFC) is a well known concurrent checking technique for ensuring that a program’s instruction execution sequence follows permissible paths. Almost all CFC...