52 search results - page 1 / 11 » A Design-for-Testability Technique for Detecting Delay Fault... |
GLVLSI
1998
IEEE
13 years 9 months ago
1998
IEEE
DSN
2004
IEEE
13 years 8 months ago
2004
IEEE
This paper presents a novel circuit fault detection and isolation technique for quasi delay-insensitive asynchronous circuits. We achieve fault isolation by a combination of physi...
ETS
2006
IEEE
13 years 10 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. Noise analysis techniques can detect some of such noise faults, but accu...
ET
2010
13 years 3 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...