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TVLSI
2008
176views more  TVLSI 2008»
13 years 4 months ago
A Fuzzy Optimization Approach for Variation Aware Power Minimization During Gate Sizing
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...
ISVLSI
2008
IEEE
142views VLSI» more  ISVLSI 2008»
13 years 11 months ago
A Fuzzy Approach for Variation Aware Buffer Insertion and Driver Sizing
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
Venkataraman Mahalingam, Nagarajan Ranganathan
ISQED
2007
IEEE
152views Hardware» more  ISQED 2007»
13 years 11 months ago
Variation Aware Timing Based Placement Using Fuzzy Programming
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
Venkataraman Mahalingam, N. Ranganathan
PATMOS
2007
Springer
13 years 11 months ago
Soft Error-Aware Power Optimization Using Gate Sizing
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
Foad Dabiri, Ani Nahapetian, Miodrag Potkonjak, Ma...
TCAD
2008
172views more  TCAD 2008»
13 years 5 months ago
General Methodology for Soft-Error-Aware Power Optimization Using Gate Sizing
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodr...