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» A Genetic Testing Framework for Digital Integrated Circuits
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ICTAI
2002
IEEE
13 years 9 months ago
A Genetic Testing Framework for Digital Integrated Circuits
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
Xiaoming Yu, Alessandro Fin, Franco Fummi, Elizabe...
INTEGRATION
2006
102views more  INTEGRATION 2006»
13 years 4 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
EH
2000
IEEE
123views Hardware» more  EH 2000»
13 years 9 months ago
The Test Vector Problem and Limitations to Evolving Digital Circuits
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digit...
Kosuke Imamura, James A. Foster, Axel W. Krings
ITC
1996
IEEE
107views Hardware» more  ITC 1996»
13 years 8 months ago
Digital Integrated Circuit Testing using Transient Signal Analysis
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
ICCS
2004
Springer
13 years 10 months ago
Designing Digital Circuits for the Knapsack Problem
Abstract. Multi Expression Programming (MEP) is a Genetic Programming variant that uses linear chromosomes for solution encoding. A unique feature of MEP is its ability of encoding...
Mihai Oltean, Crina Grosan, Mihaela Oltean