93 search results - page 4 / 19 » A Genetic Testing Framework for Digital Integrated Circuits |
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
GECCO
2006
Springer
13 years 9 months ago
2006
Springer
Genetic Parallel Programming (GPP) is a novel Genetic Programming paradigm. Based on the GPP paradigm and a local search operator - FlowMap, a logic circuit synthesizing system in...
WCE
2007
13 years 7 months ago
2007
Improving testability during the early stages of High-level synthesis has several advantages including reduced test hardware overhead and design iterations. Recently, BIST techniq...
EH
2003
IEEE
13 years 11 months ago
2003
IEEE
This paper describes a multi-objective Evolutionary Algorithm (EA) system for the synthesis of efficient non-linear VLSI circuit modules. The EA takes the specification for a no...
ICES
2000
Springer
13 years 9 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...