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ISVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
Performance, power, and functionality, yield and manufacturability are rapidly becoming additional critical factors that must be considered at higher levels of ion. A possible sol...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
In Deep Sub-Micron (DSM) technologies, interconnects play a crucial role in the correct functionality and largely impact the performance of complex System-on-Chip (SoC) designs. F...