2 search results - page 1 / 1 » A New Bare Die Test Methodology |
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under t...