22 search results - page 2 / 5 » A New Functional Fault Model for FPGA Application-Oriented T... |
TVLSI
1998
13 years 5 months ago
1998
Abstract—We introduce a technique for on-line built-in selftesting (BIST) of bus-based field programmable gate arrays (FPGA’s). This system detects deviations from the intende...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...
GLVLSI
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
MTDT
2000
IEEE
13 years 9 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...