76 search results - page 1 / 16 » A New Statistical Approach for Glitch Estimation in Combinat... |
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
— Low-power consumption has become a highly important concern for synchronous standard-cell design, and consequently mandates the use of low-power design methodologies and techni...
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. Howeve...
GLVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
A probabilistic power estimation technique for combinational circuits is presented. A novel set of simple waveforms is the kernel of this technique. The transition density of each...
ICCAD
1994
IEEE
13 years 8 months ago
1994
IEEE
ICCAD
1992
IEEE
13 years 8 months ago
1992
IEEE
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...