3 search results - page 1 / 1 » A P1500 Compliant BIST-Based Approach to Embedded RAM Diagno... |
ATS
2001
IEEE
13 years 8 months ago
2001
IEEE
IOLTS
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
1 This paper addresses the issue of testing and diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper that follows a progr...