3 search results - page 1 / 1 » A Parametric Test Method for Analog Components in Integrated... |
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ROBIO
2006
IEEE
13 years 10 months ago
2006
IEEE
— A fully embedded tactile/force sensor system to be installed on the phalanges of a robot hand is presented in this paper. The sensor consists of a distributed array of analog t...
ISCAS
2005
IEEE
13 years 10 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...