8 search results - page 2 / 2 » A Partitioning and Storage Based Built-In Test Pattern Gener... |
ICES
2000
Springer
13 years 8 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...