33 search results - page 1 / 7 » A Pattern Generation Technique for Maximizing Power Supply C... |
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...