8 search results - page 1 / 2 » A Polynomial Time Optimal Diode Insertion Routing Algorithm ... |
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Abstract—Antenna problem is a phenomenon of plasma-induced gateoxide degradation. It directly affects manufacturability of very large scale integration (VLSI) circuits, especiall...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
As technology enters the nanometer territory, the antenna effect plays an important role in determining the yield and reliability of a VLSI circuit. Diode insertion and jumper in...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Antenna effect may damage gate oxides during plasma-based fabrication process. The antenna ratio of total exposed antenna area to total gate oxide area is directly related to the ...
DAC
2005
ACM
14 years 5 months ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
As VLSI technology enters the nanoscale regime, interconnect delay has become the bottleneck of the circuit timing. As one of the most powerful techniques for interconnect optimiz...