6 search results - page 1 / 2 » A Redundant Fault Identification Algorithm with Exclusive-OR... |
ASPDAC
1998
ACM
13 years 9 months ago
1998
ACM
−This paper describes a new redundant fault identification algorithm with Exclusive-OR circuit reduction. The experimental results using this algorithm with a FAN-based test patt...
ICCAD
1991
IEEE
13 years 8 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
We discuss fault equivalence and dominance relations for multiple output combinational circuits. The conventional definition for equivalence says that “Two faults are equivalen...
VLSID
2005
IEEE
13 years 10 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...