144 search results - page 1 / 29 » A Self-Test Approach Using Accumulators as Test Pattern Gene... |
ISCAS
1995
IEEE
13 years 8 months ago
1995
IEEE
: Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. Thispaper unalyzes tlie patiern...
DELTA
2008
IEEE
13 years 11 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
ETS
2009
IEEE
13 years 2 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
ICCAD
1994
IEEE
13 years 9 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
VTS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...