7 search results - page 1 / 2 » A Simple Coverage-Based Locator for Multiple Faults |
ICST
2009
IEEE
13 years 11 months ago
2009
IEEE
Fault localization helps spotting faults in source code by exploiting automatically collected data. Deviating from other fault locators relying on hit spectra or test coverage inf...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
The interconnection network consumes the majority of die area in an FPGA. Presented is a scalable manufacturing test method for all SRAM-based FPGAs, able to detect multiple inter...
SRDS
1993
IEEE
13 years 9 months ago
1993
IEEE
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified a...
DCC
2005
IEEE
14 years 4 months ago
2005
IEEE
Elliptic curve cryptosystems in the presence of faults were studied by Biehl, Meyer and M?uller (2000). The first fault model they consider requires that the input point P in the c...