420 search results - page 2 / 84 » A Small Test Generator for Large Designs |
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
AWCC
2004
Springer
13 years 10 months ago
2004
Springer
This paper proposes progressive group testing techniques to test large number of Web services (WS) available on Internet. At the unit testing level, the WS with the same functional...
BMCBI
2006
13 years 5 months ago
2006
Background: Supervised learning for classification of cancer employs a set of design examples to learn how to discriminate between tumors. In practice it is crucial to confirm tha...
BMCBI
2006
13 years 5 months ago
2006
Background: The Thymidine kinase (Tk) mutants generated from the widely used L5178Y mouse lymphoma assay fall into two categories, small colony and large colony. Cells from the la...