7 search results - page 1 / 2 » A deductive technique for diagnosis of bridging faults |
ICCAD
1997
IEEE
13 years 8 months ago
1997
IEEE
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational ...
ITC
1998
IEEE
13 years 8 months ago
1998
IEEE
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...
ASPDAC
2001
ACM
13 years 8 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...