8 search results - page 1 / 2 » A diagnosis algorithm for extreme space compaction |
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ICDE
2004
IEEE
14 years 6 months ago
2004
IEEE
The indexing technique commonly used for long strings, such as genomes, is the suffix tree, which is based on a vertical (intra-path) compaction of the underlying trie structure. ...
SIGCOMM
2006
ACM
13 years 10 months ago
2006
ACM
Many networking applications require fast state lookups in a concurrent state machine, which tracks the state of a large number of flows simultaneously. We consider the question ...
ICCV
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper presents a new algorithm for the automatic recognition of object classes from images (categorization). Compact and yet discriminative appearance-based object class mode...