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2009
IEEE

A diagnosis algorithm for extreme space compaction

9 years 8 months ago
A diagnosis algorithm for extreme space compaction
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builtin self-test (BIST) and multi-site testing are quite effective cost reduction techniques which may make diagnosis more complex. This paper presents a test response compaction scheme and a corresponding diagnosis algorithm which are especially suited for BIST and multi-site testing. The experimental results on industrial designs show, that test time and response data volume reduces significantly and the diagnostic resolution even improves with this scheme. A comparison with X-Compact indicates, that simple parity information provides higher diagnostic resolution per response data bit than more complex signatures. Keywords— Diagnosis, Embedded diagnosis, Multi-site test, Compaction, Design-for-test
Stefan Holst, Hans-Joachim Wunderlich
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where DATE
Authors Stefan Holst, Hans-Joachim Wunderlich
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