7 search results - page 2 / 2 » A hybrid scheme for compacting test responses with unknown v... |
DAC
2005
ACM
13 years 7 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detectio...