The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the...
In the area of testing communication systems, the interfaces between systems to be tested and their testers have great impact on test generation and fault detectability. Several t...
Gang Luo, Rachida Dssouli, Gregor von Bochmann, Pa...
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...