44 search results - page 1 / 9 » A new statistical max operation for propagating skewness in ... |
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
Statistical static timing analysis (SSTA) is emerging as a solution for predicting the timing characteristics of digital circuits under process variability. For computing the stat...
ASPDAC
2008
ACM
13 years 7 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper focuses on statistical interconnect timing analysis in a parameterized block-based statistical static timing analysis tool. In particular, a new framework for performin...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Ma...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
Variability in process parameters is making accurate timing analysis of nano-scale integrated circuits an extremely challenging task. In this paper, we propose a new algorithm for...