617 search results - page 1 / 124 » A novel criticality computation method in statistical timing... |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
Abstract-- In this paper we present the Statistical Retimingbased Timing Analysis (SRTA) algorithm. The goal is to compute the timing slack distribution for the nodes in the timing...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...