26 search results - page 5 / 6 » A novel scan architecture for power-efficient, rapid test |
NDSS
2005
IEEE
13 years 11 months ago
2005
IEEE
As national infrastructure becomes intertwined with emerging global data networks, the stability and integrity of the two have become synonymous. This connection, while necessary,...
ICIP
2008
IEEE
14 years 6 days ago
2008
IEEE
Conventional electrophotographic printers tend to produce Moir´e artifacts when used for printing images scanned from printed material such as books and magazines. We propose a n...
ISLPED
2009
ACM
14 years 9 days ago
2009
ACM
Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
ASPLOS
2004
ACM
13 years 11 months ago
2004
ACM
Embedded software must meet conflicting requirements such as being highly reliable, running on resource-constrained platforms, and being developed rapidly. Static program analysi...
MICRO
2009
IEEE
14 years 12 days ago
2009
IEEE
Many-core scaling now faces a power wall. The gap between the number of cores that fit on a die and the number that can operate simultaneously under the power budget is rapidly i...