Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
Abstract—This paper presents TestFul, an evolutionary testing approach for Java classes that works both at class and method level. TestFul exploits a multi-objective evolutionary...
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
We describe a method for learning formulas in firstorder logic using a brute-force, smallest-first search. The method is exceedingly simple. It generates all irreducible well-form...