1175 search results - page 2 / 235 » A scalable method for the generation of small test sets |
ISSRE
2000
IEEE
13 years 10 months ago
2000
IEEE
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
ICST
2010
IEEE
13 years 4 months ago
2010
IEEE
Abstract—This paper presents TestFul, an evolutionary testing approach for Java classes that works both at class and method level. TestFul exploits a multi-objective evolutionary...
FM
1998
Springer
13 years 10 months ago
1998
Springer
VLSID
2002
IEEE
14 years 6 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
AAAI
1994
13 years 7 months ago
1994
We describe a method for learning formulas in firstorder logic using a brute-force, smallest-first search. The method is exceedingly simple. It generates all irreducible well-form...