249 search results - page 1 / 50 » A secure scan design methodology |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presen...
DSD
2005
IEEE
13 years 10 months ago
2005
IEEE
In the paper, the principles of Scan Educational Tool are presented. First, the motivation for this activity is briefly mentioned. Then, the structure of software package together...
TCAD
1998
13 years 4 months ago
1998
Conventional scan design imposes considerable area and delay overhead by using larger scan
ip-
ops and additional scan wires without utilizing the functionality of the combinatio...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...