24 search results - page 2 / 5 » A selective pattern-compression scheme for power and test-da... |
TWC
2010
13 years 9 days ago
2010
In this paper, a reduced-complexity partial transmit sequences (PTS) scheme is proposed to resolve the intrinsic high peak-to-average power ratio (PAPR) problem of orthogonal frequ...
ICCD
2002
IEEE
14 years 2 months ago
2002
IEEE
Power is considered to be the major limiter to the design of more faster and complex processors in the near future. In order to address this challenge, a combination of process, c...
ASPDAC
2009
ACM
13 years 3 months ago
2009
ACM
The proliferation of Chip Multiprocessors (CMPs) has led to the integration of large on-chip caches. For scalability reasons, a large on-chip cache is often divided into smaller ba...
DAC
2004
ACM
14 years 6 months ago
2004
ACM
Power consumption, particularly runtime leakage, in long on-chip buses has grown to an unacceptable portion of the total power budget due to heavy buffer insertion to combat RC de...
DFT
2002
IEEE
13 years 10 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...