Sciweavers

11 search results - page 2 / 3
» A systematic approach to modeling and analysis of transient ...
Sort
View
DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
13 years 11 months ago
Layout to Logic Defect Analysis for Hierarchical Test Generation
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
VLSID
1997
IEEE
98views VLSI» more  VLSID 1997»
13 years 9 months ago
Synthesis for Logical Initializability of Synchronous Finite State Machines
—Logical initializability is the property of a gate-level circuit whereby it can be driven to a unique start state when simulated by a three-valued (0, 1, ) simulator. In practic...
Montek Singh, Steven M. Nowick
AB
2007
Springer
13 years 11 months ago
Relating Attractors and Singular Steady States in the Logical Analysis of Bioregulatory Networks
Abstract. In 1973 R. Thomas introduced a logical approach to modeling and analysis of bioregulatory networks. Given a set of Boolean functions describing the regulatory interaction...
Heike Siebert, Alexander Bockmayr
VTS
2002
IEEE
120views Hardware» more  VTS 2002»
13 years 9 months ago
Software-Based Weighted Random Testing for IP Cores in Bus-Based Programmable SoCs
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
Madhu K. Iyer, Kwang-Ting Cheng
ICCAD
1999
IEEE
148views Hardware» more  ICCAD 1999»
13 years 9 months ago
SAT based ATPG using fast justification and propagation in the implication graph
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
Paul Tafertshofer, Andreas Ganz