As Field-Programmable Gate Array (FPGA) power consumption continues to increase, lower power FPGA circuitry, architectures, and Computer-Aided Design (CAD) tools need to be develo...
Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized...
Guarded evaluation is a power reduction technique that involves identifying sub-circuits (within a larger circuit) whose inputs can be held constant (guarded) at specific times d...
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...
ABSTRACT { Sub-micron technologies and the increasing size and complexity of integrated components have aggravated the eect of long interconnects and buses, compared to that of ga...