2 search results - page 1 / 1 » Accurate Whole-Chip Diagnostic Strategy for Scan Designs wit... |
ET
2006
13 years 4 months ago
2006
1 Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of the...
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...