17 search results - page 4 / 4 » Addressing sampling errors and diversity loss in UMDA |
IMC
2009
ACM
13 years 11 months ago
2009
ACM
The complexity of modern enterprise networks is ever-increasing, and our understanding of these important networks is not keeping pace. Our insight into intra-subnet traffic (sta...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...