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ICCD
2003
IEEE
143views Hardware» more  ICCD 2003»
13 years 10 months ago
Aggressive Test Power Reduction Through Test Stimuli Transformation
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
Ozgur Sinanoglu, Alex Orailoglu
ITC
2002
IEEE
114views Hardware» more  ITC 2002»
13 years 10 months ago
Scan Power Reduction Through Test Data Transition Frequency Analysis
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
ICIP
2003
IEEE
14 years 6 months ago
Adaptive system on a chip (ASOC): a backbone for power-aware signal processing cores
For motion estimation (ME) and discrete cosine transform (DCT) of MPEG video encoding, content variation and perceptual tolerance in video signals can be exploited to gracefully t...
Andrew Laffely, Jian Liang, Russell Tessier, Wayne...
INFOCOM
2006
IEEE
13 years 11 months ago
Scalable Clustering of Internet Paths by Shared Congestion
— Internet paths sharing the same bottleneck can be identified using several shared congestion detection techniques. However, all of these techniques have been designed to detec...
Min Sik Kim, Taekhyun Kim, YongJune Shin, Simon S....