39 search results - page 7 / 8 » An Automatic Test Pattern Generator for Large Sequential Cir... |
BMCBI
2010
13 years 3 months ago
2010
Background: The analysis of Inter-Alu PCR patterns obtained from human genomic DNA samples is a promising technique for a simultaneous analysis of many genomic loci flanked by Alu...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
MEMOCODE
2007
IEEE
14 years 1 days ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
ICCAD
2002
IEEE
14 years 2 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
DAC
2010
ACM
13 years 9 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...