Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-...
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
RFID is an emerging technology with many potential applications such as inventory management for supply chain. In practice, these applications often need a series of continuous sca...