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ITC
2003
IEEE
112views Hardware» more  ITC 2003»
13 years 10 months ago
Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault
Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-...
AAAI
2007
13 years 7 months ago
A Qualitative Approach to Multiple Fault Isolation in Continuous Systems
The multiple fault diagnosis problem is important, since the single fault assumption can lead to incorrect or failed diagnoses when multiple faults occur. It is challenging for co...
Matthew J. Daigle, Xenofon D. Koutsoukos, Gautam B...
AAAI
1993
13 years 6 months ago
Hybrid Case-Based Reasoning for the Diagnosis of Complex Devices
A novel approach to integrating case-based reasoning with model-based diagnosis is presented. The main idea is to use the model of the device and the results of diagnostic tests t...
Michel P. Féret, Janice I. Glasgow
ICSM
2009
IEEE
13 years 3 months ago
Effective and efficient localization of multiple faults using value replacement
We previously presented a fault localization technique called Value Replacement that repeatedly alters the state of an executing program to locate a faulty statement [9]. The tech...
Dennis Jeffrey, Neelam Gupta, Rajiv Gupta
DAC
2000
ACM
14 years 6 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski