Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-...
The multiple fault diagnosis problem is important, since the single fault assumption can lead to incorrect or failed diagnoses when multiple faults occur. It is challenging for co...
Matthew J. Daigle, Xenofon D. Koutsoukos, Gautam B...
A novel approach to integrating case-based reasoning with model-based diagnosis is presented. The main idea is to use the model of the device and the results of diagnostic tests t...
We previously presented a fault localization technique called Value Replacement that repeatedly alters the state of an executing program to locate a faulty statement [9]. The tech...
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...