2 search results - page 1 / 1 » An Enhanced Test Generator for Capacitance Induced Crosstalk... |
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
ET
2002
13 years 4 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...