67 search results - page 1 / 14 » An IDDQ Sensor for Concurrent Timing Error Detection |
DFT
1997
IEEE
13 years 9 months ago
1997
IEEE
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...
FTCS
1994
13 years 6 months ago
1994
This paper examines architectural techniques for providing concurrent error detection in self-timed VLSI pipelines. Signal pairs from Differential Cascode Voltage Switch Logic are...
TVLSI
2002
13 years 4 months ago
2002
Concurrent error detection (CED) based on time redundancy entails performing the normal computation and the re-computation at different times and then comparing their results. Time...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
CHES
2004
Springer
13 years 10 months ago
2004
Springer
Because of the rapidly shrinking dimensions in VLSI, transient and permanent faults arise and will continue to occur in the near future in increasing numbers. Since cryptographic c...